Powell, Evaluation of Formulas for Inner-Shell Ionization Cross Sections, in Use of Monte blackjack table rules las vegas Carlo Calculations in Eletron Probe Microanalysis and Scanning Electron Microscopy,.
Y., Electron Stopping Powers-A Progress Report, Scanning, Vol.
And Lodding., Calulation and tabulation of Mott cross-sections for large-angle electron scattering, Scanning, Vol.
Newbury, A Comparison of Monte Carlo and Phi-Rho-Z Calculations of Thin Films, Scanning, Proceedings of Scanning 92, II-13, Vol.Monte Carlo Particle Program.Zhenyu Tan, YueYuan Xia, Xiangdong Liub and Minwen Zhao, Monte-Carlo simulation of low-energy electron scattering in pmma using stopping powers from dielectric formalism, Microelectronic Engineering, Volume 77, Issues 3-4, April 2005, Pages 285-291.ST-Laurent, Quantitative X-Ray Microanalysis of Spherical Inclusion Embeded in a Matrix Using a SEM and Monte Carlo Simulations, Scanning, Vol.Hovington, The Use of Monte Carlo Simulations in Scanning Eectron Microscopy (SEM) to Understand Contrast Mechanisms of SEM Images of Bi-Phased Materials at Low Voltages, Sacanning, Vol.Joy, Monte Carlo Simulation of CL and ebic Contrast for Isolated Dislocations, Scanning, Vol.Fakhfakh, Monte Carlo Calculation of the X-Ray Depth Distributions in an Aluminium Target, Microsc.Yakowitz, Eds., NBS Special Publications 460, Washington, 129-138, 1976.
Bishop, The History and Development of Monte Carlo Methods for Use in X-Ray Microanalysis, in Use of Monte Carlo Calculations in Eletron Probe Microanalysis and Scanning Electron Microscopy,.Gergely, Mott Factors of P, V, Fe, Ga, As, Pd, In, Ta in W for eV Electrons, Scanning, Vol.Newbury, Eds., Plenum Press, 105-143, 1990.MC programs at Michigan Technological University.Shimizu, A Monte Carlo Modeling of Electron Interaction with Solids Incuding Cascade Secondary Electron Production, Scanning, Vol.